Evaluation of Durability and Reliability of Power Semiconductor Device for Traction Motor Driver of Hybrid Vehicle
ハイブリッド車モータ駆動用電力半導体の耐久信頼性評価
- Delivery
- Available on this site
- Format
- Price
- Non-members (tax incl.):¥1,100 Members (tax incl.):¥880
- Publication code
- 20015190
- Paper/Info type
- Proceedings (Spring)
No.27-01
- Pages
- 13-16(Total 4 p)
- Date of publication
- May 2001
- Publisher
- JSAE
- Language
- Japanese
Detailed Information
| Author(J) | 1) 古川 勝彦, 2) 篠原 貞夫 |
|---|---|
| Author(E) | 1) Katsuhiko Furukawa, 2) Sadao Shinohara |
| Affiliation(J) | 1) 本田技術研究所, 2) 本田技術研究所 |
| Affiliation(E) | 1) Honda R&D CO.,LTD., 2) Honda R&D CO.,LTD. |
| Abstract(J) | ハイブリッド車におけるモータ駆動用電力半導体部品の電流と発熱温度に対しての単体寿命特性と完成車使用環境との相関を明確にし、ハイブリッド車における信頼度を求めた。その結果、量産時の工程品質および信頼性が確認でき、あわせて耐久信頼性の評価手法が確立できた。 Translation |
| Abstract(E) | Reliability of power semiconductor device for traction motor driver of hybrid vehicle was verified through clarification of relationship between unit duration characteristics and actual service environment regarding electric current and temperature by heat generation. Reliability of 99.915% was obtained, and mass-production process quality and reliability were confirmed. Further, evaluation method of durability and reliability was established. |