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Summary & Details

Accelerated Reliability Assessment for Power Electronics: Optimizing Traditional Testing Methods for EV Applications

Delivery: Available on this site

Format: PDF

Price: Non-members (tax incl.)：￥1,100 Members (tax incl.)：￥880

Publication code: 20265278

Paper/Info type: Proceedings (Spring)

No.64-26

Pages: 1-8(Total 8 p)

Date of publication: May 2026

Publisher: JSAE

Language: English

Event: 2026 JSAE Annual Congress (Spring)

Detailed Information

Author(J)	1) Gerard Ibars Escarre, 2) Yasmine Himene, 3) Javier A. Corea-Araujo, 4) Agustin Bucciarelli, 5) Abdelali El Aroudi
Author(E)	1) Gerard Ibars Escarre, 2) Yasmine Himene, 3) Javier A. Corea-Araujo, 4) Agustin Bucciarelli, 5) Abdelali El Aroudi
Affiliation(J)	1) Applus+ IDIADA, 2) Applus+ IDIADA, 3) Applus+ IDIADA, 4) Applus+ IDIADA, 5) Universitat Rovira i Virgili
Affiliation(E)	1) Applus+ IDIADA, 2) Applus+ IDIADA, 3) Applus+ IDIADA, 4) Applus+ IDIADA, 5) Universitat Rovira i Virgili
Abstract(E)	This paper investigates how optimized accelerated testing methodologies can reduce validation timeframes for power electronics in electric vehicle development. Current OEM approaches utilizing Power-Thermal-Cycle-Endurance and High-Temperature-Operation-Endurance protocols require >6-month validation cycles, conflicting with 2-year EV production timelines. Laboratory data reveals limitations applying conventional power cycling to GaN-based OBCs and SiC DC-DC converters, where standard Coffin-Manson models show reduced applicability. Analysis of physics-of-failure approaches and mission profile-oriented strategies demonstrates potential timeframe reductions. Results indicate properly configured accelerated aging tests incorporating junction temperature swing control and realistic switching conditions maintain reliability assessment accuracy while significantly accelerating validation processes for modern automotive power electronics.

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