Accelerated Reliability Assessment for Power Electronics: Optimizing Traditional Testing Methods for EV Applications
- 提供方法
- 本サイト上にてダウンロード・閲覧可
- 形態
- 価格
- 一般価格(税込)：￥1,100 会員価格(税込)：￥880
- 文献番号
- 20265278
- 文献・情報種別
- 学術講演会予稿集（春）
No.64-26
- 掲載ページ
- 1-8(Total 8 p)
- 発行年月
- 2026年 5月
- 出版社
- (公社)自動車技術会
- 言語
- 英語
- イベント
- 2026年春季大会
書誌事項
| 著者 | 1) Gerard Ibars Escarre, 2) Yasmine Himene, 3) Javier A. Corea-Araujo, 4) Agustin Bucciarelli, 5) Abdelali El Aroudi |
|---|---|
| 著者（英） | 1) Gerard Ibars Escarre, 2) Yasmine Himene, 3) Javier A. Corea-Araujo, 4) Agustin Bucciarelli, 5) Abdelali El Aroudi |
| 勤務先 | 1) Applus+ IDIADA, 2) Applus+ IDIADA, 3) Applus+ IDIADA, 4) Applus+ IDIADA, 5) Universitat Rovira i Virgili |
| 勤務先（英） | 1) Applus+ IDIADA, 2) Applus+ IDIADA, 3) Applus+ IDIADA, 4) Applus+ IDIADA, 5) Universitat Rovira i Virgili |
| 抄録（英） | This paper investigates how optimized accelerated testing methodologies can reduce validation timeframes for power electronics in electric vehicle development. Current OEM approaches utilizing Power-Thermal-Cycle-Endurance and High-Temperature-Operation-Endurance protocols require >6-month validation cycles, conflicting with 2-year EV production timelines. Laboratory data reveals limitations applying conventional power cycling to GaN-based OBCs and SiC DC-DC converters, where standard Coffin-Manson models show reduced applicability. Analysis of physics-of-failure approaches and mission profile-oriented strategies demonstrates potential timeframe reductions. Results indicate properly configured accelerated aging tests incorporating junction temperature swing control and realistic switching conditions maintain reliability assessment accuracy while significantly accelerating validation processes for modern automotive power electronics. 翻訳 |
